材料科學與工程著作係列：微觀組織的分析電子顯微學錶徵（英文版） [HEP Series in Materials Science and Engineering:Characterization of Microstructures by Analytical Electron Microscopy(AEM)] pdf epub mobi txt 电子书 下载 2025

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戎詠華 著

出版社： 高等教育出版社

ISBN：9787040300925

版次：1

商品编码：10903780

包装：精装

外文名称：HEP Series in Materials Science and Engineering:Characterization of Microstructures by Analytical Electron Microscopy(AEM)#

內容簡介

《材料科學與工程著作係列：微觀組織的分析電子顯微學錶徵（英文版）》介紹瞭分析電子顯微學（AEM）的基本概念和操作技術，聚集於相戀和形變中位錯的AEM研究。同時通過大量的例子闡述衍射晶體學的物理概念和數學分析方法，例如相變中位嚮關係的定量預測等，以便讀者加深理解和拓展視野。
《材料科學與工程著作係列：微觀組織的分析電子顯微學錶徵（英文版）》可作為材料科學與工程以及凝聚態物理領域的學者和研究生的參考書。

作者簡介

戎詠華，上海交通大學材料科學與工程學院教授。

目錄

Chapter 1 Analytical Electron Microscope （AEM）
1.1 Brief introduction of AEM history
1.2 Interaction between electrons and specimen and signals used by AEM
1.3 Electron wavelength and electromagnetic lens
1.3.1 Electron wavelength
1.3.2 Electromagnetic lens
1.4 Structure and function of AEM
1.4.1 Illumination system
1.4.2 Specimen holders
1.4.3 Imaging system
1.4.4 Image recording
1.4.5 Power supply system and vacuum system
1.4.6 Computer control '
1.5 The principle of imaging, magnifying and diffracting
1.6 Theoretical resolution limit
1.7 Depth of focus and depth of field
1.8 Spherical aberration-c0rrected TEMs References

Chapter 2 Specimen Preparation
2.1 Traditional techniques
2.1.1 Replica
2.1.2 Preparation of powders
2.1.3 Film preparation for plan view
2.1.4 Film preparation from a bulk metallic sample .
2.1.5 Film preparation from a bulk nonmetaltic sample.
2.2 Special techniques
2.2.1 Cross-sectional specimen preparation
2.2.2 Cleaving and small angle cleavage technique
2.2.3 Ultramicrotomy
2.2.4 Focused ion beam technique References

Chapter 3 Electron Diffraction
3.1 Comparison of electron diffraction with X-ray diffraction
3.2 Conditions of diffraction
3.2.1 Geometric condition
3.2.2 Physical condition
3.2.3 Diffraction deviating from exact Bragg Condition
3.3 Basic equation used for analysis of electron diffraction pattern
3.3.1 Diffraction in an electron diffractometer
3.3.2 Diffraction in a TEM
3.4 Principle and operation of selected area electron diffraction
3.5 Rotation of image relative to diffraction pattern
3.6 Diffraction patterns of polycrystal and their applications
3.6.1 Formation and geometric features of diffraction patterns for polycrystal
3.6.2 Applications of ring patterns
3.7 Geometric features of diffraction patterns of single crystals
3.7.1 Geometric features and diffraction intensity of a single crystal pattern
3.7.2 Indexing methods of single crystal diffraction patterns
3.8 Main applications of single crystal pattern
3.8.1 Identification of phases
3.8.2 Determination of orientation relationship
3.9 Diffraction spot shift by stacking faults and determination of stacking fault probability
3.9.1 Diffraction from planar defect
3.9.2 Determination of stacking fault probability in HCP crystal
3.9.3 Determination of stacking fault probability in FCC crystal
3.10 Systematic tilting technique and its applications
3.10.1 Systematic tilting technique by double tilt holder.
3.10.2 Determination of electron beam direction
……
Chapter 4 Mathematics Analysis in Electron Diffraction and Crystallography
Chapter 5 Diffraction Contrast
Chapter 6 high Resolution and High Spatial Resolution of Analytica electron Microscopy
Appendix
Index

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英文版，好书值得一读

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主要看看分析原理和术语怎么表达，原版和翻译的感觉完全不一样

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评分☆☆☆☆☆

很好的书，对学习电镜很有用！

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评分☆☆☆☆☆

英文版，好书值得一读

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书很好，但最好先看一下相关的中文资料较好

评分☆☆☆☆☆

英文版，好书值得一读